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An expanded X-ray beam facility (BEaTriX) to test the modular elements of the ATHENA optics

机译:扩展的X射线束设施(BEaTriX),用于测试模块化元件   aTHENa光学系统

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摘要

Future large X-ray observatories like ATHENA will be equipped with very largeoptics, obtained by assembling modular optical elements, named X-ray OpticalUnits (XOU) based on the technology of either Silicon Pore Optics or SlumpedGlass Optics. In both cases, the final quality of the modular optic (a 5 arcsecHEW requirement for ATHENA) is determined by the accuracy alignment of the XOUswithin the assembly, but also by the angular resolution of the individual XOU.This is affected by the mirror shape accuracy, its surface roughness, and themutual alignment of the mirrors within the XOU itself. Because of the largenumber of XOUs to be produced, quality tests need to be routinely done toselect the most performing stacked blocks, to be integrated into the finaloptic. In addition to the usual metrology based on profile and roughnessmeasurements, a direct measurement with a broad, parallel, collimated anduniform X- ray beam would be the most reliable test, without the need of afocal spot reconstruction as usually done in synchrotron light. To this end, wedesigned the BEaTriX (Beam Expander Testing X-ray facility) to be realized atINAF-OAB, devoted to the functional tests of the XOUs. A grazing incidenceparabolic mirror and an asymmetrically cut crystal will produce a parallelX-ray beam broad enough to illuminate the entire aperture of the focusingelements. An X-ray camera at the focal distance from the mirrors will directlyrecord the image. The selection of different crystals will enable to test theXOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA(0.2-12 keV). In this paper we discuss a possible BEaTriX facilityimplementation. We also show a preliminary performance simulation of theoptical system.
机译:未来的大型X射线观测站(如ATHENA)将配备非常大的光学元件,这些光学元件是通过组装模块化光学元件(称为X射线光学单元(XOU))而获得的,这些光学元件基于硅孔光学或SlumpedGlass Optics技术。在这两种情况下,模块化光学元件的最终质量(雅典娜要求5 arcsecHEW)都取决于组件中XOU的精度对准,还取决于单个XOU的角分辨率,这受反射镜形状精度影响,其表面粗糙度以及XOU自身内部的反射镜相互对准。由于要生产大量的XOU,因此需要例行进行质量测试,以选择性能最高的堆叠模块,以将其集成到最终光学器件中。除了基于轮廓和粗糙度测量的常规度量之外,使用宽,平行,准直和均匀的X射线束进行直接测量将是最可靠的测试,而无需像通常在同步加速器光中那样进行焦斑重建。为此,我们设计了将在INAF-OAB上实现的BEaTriX(光束扩展器测试X射线设备),专门用于XOU的功能测试。掠入射抛物面镜和不对称切割的晶体将产生足够宽的平行X射线束,以照亮聚焦元件的整个孔径。距反射镜焦距的X射线照相机将直接记录图像。选择不同的晶体将能够测试1-5 keV范围内的XOU,包括在雅典娜(0.2-12 keV)的X射线能带中。在本文中,我们讨论了可能的BEaTriX工具实现。我们还显示了光学系统的初步性能仿真。

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